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Micro‐Raman characterization of structural defects in patterned GaAs‐on‐Si
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10.1063/1.104070
/content/aip/journal/apl/57/16/10.1063/1.104070
http://aip.metastore.ingenta.com/content/aip/journal/apl/57/16/10.1063/1.104070
/content/aip/journal/apl/57/16/10.1063/1.104070
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/content/aip/journal/apl/57/16/10.1063/1.104070
1990-10-15
2014-09-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Micro‐Raman characterization of structural defects in patterned GaAs‐on‐Si
http://aip.metastore.ingenta.com/content/aip/journal/apl/57/16/10.1063/1.104070
10.1063/1.104070
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