1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Correlation length of interface roughness and its enhancement in molecular beam epitaxy grown GaAs/AlAs quantum wells studied by mobility measurement
Rent:
Rent this article for
USD
10.1063/1.104077
/content/aip/journal/apl/57/16/10.1063/1.104077
http://aip.metastore.ingenta.com/content/aip/journal/apl/57/16/10.1063/1.104077
/content/aip/journal/apl/57/16/10.1063/1.104077
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/57/16/10.1063/1.104077
1990-10-15
2015-04-27
Loading

Full text loading...

This is a required field
Please enter a valid email address

Oops! This section, does not exist...

Use the links on this page to find existing content.

752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation length of interface roughness and its enhancement in molecular beam epitaxy grown GaAs/AlAs quantum wells studied by mobility measurement
http://aip.metastore.ingenta.com/content/aip/journal/apl/57/16/10.1063/1.104077
10.1063/1.104077
SEARCH_EXPAND_ITEM