1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Reflection high‐energy electron diffraction dynamics study of GaAs, AlAs, and Al0.5Ga0.5As layer growth under As4 and/or As2 molecular beam species
Rent:
Rent this article for
USD
10.1063/1.103930
/content/aip/journal/apl/57/20/10.1063/1.103930
http://aip.metastore.ingenta.com/content/aip/journal/apl/57/20/10.1063/1.103930
/content/aip/journal/apl/57/20/10.1063/1.103930
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/57/20/10.1063/1.103930
1990-11-12
2014-07-12
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reflection high‐energy electron diffraction dynamics study of GaAs, AlAs, and Al0.5Ga0.5As layer growth under As4 and/or As2 molecular beam species
http://aip.metastore.ingenta.com/content/aip/journal/apl/57/20/10.1063/1.103930
10.1063/1.103930
SEARCH_EXPAND_ITEM