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Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope
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10.1063/1.103950
/content/aip/journal/apl/57/20/10.1063/1.103950
http://aip.metastore.ingenta.com/content/aip/journal/apl/57/20/10.1063/1.103950
/content/aip/journal/apl/57/20/10.1063/1.103950
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/content/aip/journal/apl/57/20/10.1063/1.103950
1990-11-12
2014-08-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope
http://aip.metastore.ingenta.com/content/aip/journal/apl/57/20/10.1063/1.103950
10.1063/1.103950
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