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Electromigration in a single crystalline submicron width aluminum interconnection
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10.1063/1.104431
/content/aip/journal/apl/58/1/10.1063/1.104431
http://aip.metastore.ingenta.com/content/aip/journal/apl/58/1/10.1063/1.104431
/content/aip/journal/apl/58/1/10.1063/1.104431
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/content/aip/journal/apl/58/1/10.1063/1.104431
1991-01-07
2014-08-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electromigration in a single crystalline submicron width aluminum interconnection
http://aip.metastore.ingenta.com/content/aip/journal/apl/58/1/10.1063/1.104431
10.1063/1.104431
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