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Secondary electron emission spectroscopy: A sensitive and novel method for the characterization of the near‐surface region of diamond and diamond films
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10.1063/1.104634
/content/aip/journal/apl/58/4/10.1063/1.104634
http://aip.metastore.ingenta.com/content/aip/journal/apl/58/4/10.1063/1.104634
/content/aip/journal/apl/58/4/10.1063/1.104634
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/content/aip/journal/apl/58/4/10.1063/1.104634
1991-01-28
2014-08-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Secondary electron emission spectroscopy: A sensitive and novel method for the characterization of the near‐surface region of diamond and diamond films
http://aip.metastore.ingenta.com/content/aip/journal/apl/58/4/10.1063/1.104634
10.1063/1.104634
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