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X‐ray rocking curve measurement of composition and strain in Si‐Ge buffer layers grown on Si substrates
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10.1063/1.104501
/content/aip/journal/apl/58/8/10.1063/1.104501
http://aip.metastore.ingenta.com/content/aip/journal/apl/58/8/10.1063/1.104501
/content/aip/journal/apl/58/8/10.1063/1.104501
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/content/aip/journal/apl/58/8/10.1063/1.104501
1991-02-25
2014-09-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X‐ray rocking curve measurement of composition and strain in Si‐Ge buffer layers grown on Si substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/58/8/10.1063/1.104501
10.1063/1.104501
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