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X‐ray rocking curve measurement of composition and strain in Si‐Ge buffer layers grown on Si substrates
1.T. P. Pearsall, F. H. Pollak, J. C. Bean, and R. Hull, Phys. Rev. B 33, 6821 (1986).
2.J. Hornstra and W. J. Bartels, J. Cryst. Growth 44, 513 (1978).
3.W. J. Bartels and W. Nijman, J. Cryst. Growth 44, 518 (1978).
4.R. People and J. C. Bean, Appl. Phys. Lett. 49, 229 (1986).
5.B. D. Cullity, Element of X-Ray Diffraction, 2nd ed. (Addison-Wesley, New York, 1978).
6.A. F. Jankowski and T. Tsakalakos, J. Phys. F 15, 1279 (1985).
7.H. B. Huntington, Solid State Physics (Academic, New York, 1958), Vol. 7, p. 213
7.[Reprinted as The Elastic Constants of Crystals (Academic, New York, 1964)].
8.M. Fatemi, J. Cryst. Growth 96, 316 (1989).
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