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Body current scanning: A novel technique for characterizing the floating body effects and parasitic bipolar action in silicon‐on‐insulator metal‐oxide‐semiconductor transistors
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10.1063/1.105279
/content/aip/journal/apl/59/12/10.1063/1.105279
http://aip.metastore.ingenta.com/content/aip/journal/apl/59/12/10.1063/1.105279
/content/aip/journal/apl/59/12/10.1063/1.105279
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/content/aip/journal/apl/59/12/10.1063/1.105279
1991-09-16
2014-10-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Body current scanning: A novel technique for characterizing the floating body effects and parasitic bipolar action in silicon‐on‐insulator metal‐oxide‐semiconductor transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/59/12/10.1063/1.105279
10.1063/1.105279
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