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Optical investigation of interface roughness and defect incorporation in GaAs/AlGaAs quantum wells grown with and without growth interruption
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10.1063/1.106109
/content/aip/journal/apl/59/17/10.1063/1.106109
http://aip.metastore.ingenta.com/content/aip/journal/apl/59/17/10.1063/1.106109
/content/aip/journal/apl/59/17/10.1063/1.106109
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/content/aip/journal/apl/59/17/10.1063/1.106109
1991-10-21
2014-12-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical investigation of interface roughness and defect incorporation in GaAs/AlGaAs quantum wells grown with and without growth interruption
http://aip.metastore.ingenta.com/content/aip/journal/apl/59/17/10.1063/1.106109
10.1063/1.106109
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