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Measurement of aluminum concentration in epitaxial layers of Al x Ga1−x As on GaAs by double axis x‐ray diffractometry
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10.1063/1.106041
/content/aip/journal/apl/59/18/10.1063/1.106041
http://aip.metastore.ingenta.com/content/aip/journal/apl/59/18/10.1063/1.106041
/content/aip/journal/apl/59/18/10.1063/1.106041
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/content/aip/journal/apl/59/18/10.1063/1.106041
1991-10-28
2014-12-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of aluminum concentration in epitaxial layers of AlxGa1−xAs on GaAs by double axis x‐ray diffractometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/59/18/10.1063/1.106041
10.1063/1.106041
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