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Surface structure of selenium‐treated GaAs (001) studied by field ion scanning tunneling microscopy
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10.1063/1.106401
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    Affiliations:
    1 Institute of Materials Science, University of Tsukuba, Tsukuba Science City 305, Japan
    2 Institute for Materials Research, Tohoku University, Katahira, Aoba‐ku, Sendai 980, Japan
    3 Institute of Materials Science, University of Tsukuba, Tsukuba Science City 305, Japan
    4 Institute for Materials Research, Tohoku University, Katahira, Aoba‐ku, Sendai 980, Japan
    5 Department of Applied Physics, The University of Tokyo, Hongo, Bunkyo‐ku, Tokyo 113, Japan
    6 Institute of Materials Science, University of Tsukuba, Tsukuba Science City 305, Japan
    7 Institute for Materials Research, Tohoku University, Katahira, Aoba‐ku, Sendai 980, Japan
    Appl. Phys. Lett. 59, 2986 (1991); http://dx.doi.org/10.1063/1.106401
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/content/aip/journal/apl/59/23/10.1063/1.106401
1991-12-02
2014-07-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Surface structure of selenium‐treated GaAs (001) studied by field ion scanning tunneling microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/59/23/10.1063/1.106401
10.1063/1.106401
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