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FLUCTUATIONS IN THE PRE‐BREAKDOWN REGION OF DOUBLE INJECTION P‐I‐N DIODES
1.Supported in part by the National Science Foundation.
2.M. A. Lampert, Phys. Rev. 125, 126 (1962).
3.M. A. Lampert and A. Rose, Phys. Rev. 121, 26 (1961).
4.K. L. Ashley and A. G. Milnes, J. Appl. Phys. 35, 369 (1964).
5.P. N. Keating, Phys. Rev. 135, A1407 (1964).
6.R. Baron, Phys. Rev., to be published.
7.R. D. Larrabee, Phys. Rev. 121, 37 (1961).
8.N. Holonyak, Jr., Proc. IRE 50, 2421 (1962).
9.K. L. Ashley, Ph.D. Thesis, Elec. Eng., Carnegie Inst, of Tech. (1963).
10.J. L. Wagener and A. G. Milnes, Solid State Electronics, to be published.
11.J. W. Mayer, R. Baron, and O. J. Marsh, Phys. Rev., to be published.
12.The devices used in these studies were kindly supplied by J. L. Wagener, A. Barnett, and A. G. Milnes from our laboratory.
13.Short circuit for ac but not for dc.
14.A. van der Ziel, Physica 29, 78 (1963).
15.A. G. Jordan, to be published.
15.Equation (1) can be recognized as the familiar expression for lifetime derived in W. Shockley and W. T. Read, Jr., Phys. Rev. 87, 835 (1952).
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