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Defects in amorphous silicon probed by subpicosecond photocarrier dynamics
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10.1063/1.107212
/content/aip/journal/apl/60/14/10.1063/1.107212
http://aip.metastore.ingenta.com/content/aip/journal/apl/60/14/10.1063/1.107212
/content/aip/journal/apl/60/14/10.1063/1.107212
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/content/aip/journal/apl/60/14/10.1063/1.107212
1992-04-06
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Defects in amorphous silicon probed by subpicosecond photocarrier dynamics
http://aip.metastore.ingenta.com/content/aip/journal/apl/60/14/10.1063/1.107212
10.1063/1.107212
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