Full text loading...
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
On the negative differential resistance effect in high‐field semiconductor‐dielectric systems
1.B. L. Thomas and W. C. Nunnally, Proceedings of the 6th IEEE Pulsed Power Conference, Arlington, VA, 1987, edited by P. J. Turchi and B. H. Bernstein (IEEE, New York, 1987), p. 149.
2.B. L. Thomas and W. C. Nunnally, Proceedings of the 7th IEEE Pulsed Power Conference, Monterrey, CA, 1989, edited by B. H. Bernstein and J. P. Shannon (IEEE, New York, 1989), p. 893.
3.F. E. Peterkin, T. Ridolfi, L. L. Buresh, B. J. Hankla, D. K. Scott, P. F. Williams, W. C. Nunnally, and B. L. Thomas, IEEE Trans. Electron. Devices 37, 2549 (1990).
4.S. H. Nam and T. S. Sudarshan, Proceedings of the 13th International Symposium on Discharges and Electrical Insulation in Vacuum, Paris, 1988, edited by J. M. Buzzi and A. Septier (Les Editionsr de Physique, France, 1988), p. 527.
5.S. H. Nam and T. S. Sudarshan, in Ref. 2, p. 362.
6.S. H. Nam and T. S. Sudarshan, IEEE Trans. Electron Devices 37, 2466 (1990).
7.S. H. Nam, Ph.D. thesis, University of South Carolina, Columbia, 1990.
8.P. F. Williams and F. E. Peterkin, in Ref. 2, p. 890.
9.R. Feuerstein and B. Senitzky, in Ref. 2, p. 358.
10.G. Gradinaru and T. S. Sudarshan (unpublished).
Article metrics loading...