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Evaluation of surface roughness of technological InP substrates by in situ scanning tunneling microscopy imaging in H2SO4 solution
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10.1063/1.108123
/content/aip/journal/apl/61/21/10.1063/1.108123
http://aip.metastore.ingenta.com/content/aip/journal/apl/61/21/10.1063/1.108123
/content/aip/journal/apl/61/21/10.1063/1.108123
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/content/aip/journal/apl/61/21/10.1063/1.108123
1992-11-23
2014-10-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Evaluation of surface roughness of technological InP substrates by insitu scanning tunneling microscopy imaging in H2SO4 solution
http://aip.metastore.ingenta.com/content/aip/journal/apl/61/21/10.1063/1.108123
10.1063/1.108123
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