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Determination of atomic density profiles in synthetic multilayers by anomalous x‐ray diffraction
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10.1063/1.109570
/content/aip/journal/apl/62/15/10.1063/1.109570
http://aip.metastore.ingenta.com/content/aip/journal/apl/62/15/10.1063/1.109570
/content/aip/journal/apl/62/15/10.1063/1.109570
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/content/aip/journal/apl/62/15/10.1063/1.109570
1993-04-12
2014-08-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of atomic density profiles in synthetic multilayers by anomalous x‐ray diffraction
http://aip.metastore.ingenta.com/content/aip/journal/apl/62/15/10.1063/1.109570
10.1063/1.109570
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