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Raman scattering analysis of relaxed Ge x Si1−x alloy layers
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10.1063/1.109481
/content/aip/journal/apl/62/17/10.1063/1.109481
http://aip.metastore.ingenta.com/content/aip/journal/apl/62/17/10.1063/1.109481
/content/aip/journal/apl/62/17/10.1063/1.109481
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/content/aip/journal/apl/62/17/10.1063/1.109481
1993-04-26
2014-10-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Raman scattering analysis of relaxed GexSi1−x alloy layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/62/17/10.1063/1.109481
10.1063/1.109481
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