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Measurement of conduction band offsets through Schottky diode transport measurements
1.J. E. A. Whiteaway, IEE Proc. 130, 165 (1983).
2.E. H. Rhoderick and R. H. Williams, in Metal-Semiconductor Contacts, 2nd ed. (Oxford University, New York, 1988), Chap. 3.
3.D. V. Morgan, K. Board, C. E. C. Wood, and L. F. Eastman, Phys. Status Solidi A 72, 251 (1982).
4.R. People, K. W. Wecht, K. Alavi, and A. Y. Cho, Appl. Phys. Lett. 43, 118 (1983).
5.C. K. Peng, A. Ketterson, H. Morkoç, P. M. Solomon, J. Appl. Phys. 60, 1709 (1986).
6.D. F. Welch, G. W. Wicks, and L. F. Eastman, J. Appl. Phys. 55, 3176 (1984).
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