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Low‐energy Ar+ ion bombardment‐induced modification of surface atomic bond lengths on InP(100) wafer
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10.1063/1.110613
/content/aip/journal/apl/63/14/10.1063/1.110613
http://aip.metastore.ingenta.com/content/aip/journal/apl/63/14/10.1063/1.110613
/content/aip/journal/apl/63/14/10.1063/1.110613
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/content/aip/journal/apl/63/14/10.1063/1.110613
1993-10-04
2014-12-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low‐energy Ar+ ion bombardment‐induced modification of surface atomic bond lengths on InP(100) wafer
http://aip.metastore.ingenta.com/content/aip/journal/apl/63/14/10.1063/1.110613
10.1063/1.110613
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