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Detection of oxygen incorporated in molecular‐beam epitaxy grown GaAs‐on‐AlAs interfaces and AlAs layers by secondary ion mass spectrometry
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10.1063/1.110650
/content/aip/journal/apl/63/14/10.1063/1.110650
http://aip.metastore.ingenta.com/content/aip/journal/apl/63/14/10.1063/1.110650
/content/aip/journal/apl/63/14/10.1063/1.110650
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/content/aip/journal/apl/63/14/10.1063/1.110650
1993-10-04
2014-09-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Detection of oxygen incorporated in molecular‐beam epitaxy grown GaAs‐on‐AlAs interfaces and AlAs layers by secondary ion mass spectrometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/63/14/10.1063/1.110650
10.1063/1.110650
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