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Method for the measurement of long minority carrier diffusion lengths exceeding wafer thickness
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10.1063/1.110292
/content/aip/journal/apl/63/21/10.1063/1.110292
http://aip.metastore.ingenta.com/content/aip/journal/apl/63/21/10.1063/1.110292
/content/aip/journal/apl/63/21/10.1063/1.110292
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/content/aip/journal/apl/63/21/10.1063/1.110292
1993-11-22
2014-07-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Method for the measurement of long minority carrier diffusion lengths exceeding wafer thickness
http://aip.metastore.ingenta.com/content/aip/journal/apl/63/21/10.1063/1.110292
10.1063/1.110292
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