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Observation of open-ended stacking fault tetrahedra in Si0.85Ge0.15 grown on V-grooved (001) Si and planar Si substrates
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10.1063/1.110317
/content/aip/journal/apl/63/21/10.1063/1.110317
http://aip.metastore.ingenta.com/content/aip/journal/apl/63/21/10.1063/1.110317
/content/aip/journal/apl/63/21/10.1063/1.110317
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/content/aip/journal/apl/63/21/10.1063/1.110317
1993-11-22
2014-10-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Observation of open-ended stacking fault tetrahedra in Si0.85Ge0.15 grown on V-grooved (001) Si and planar (11¯1) Si substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/63/21/10.1063/1.110317
10.1063/1.110317
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