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Formation of probe microscope tips in silicon by focused ion beams
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10.1063/1.111108
/content/aip/journal/apl/64/5/10.1063/1.111108
http://aip.metastore.ingenta.com/content/aip/journal/apl/64/5/10.1063/1.111108
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/content/aip/journal/apl/64/5/10.1063/1.111108
1994-01-31
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Formation of probe microscope tips in silicon by focused ion beams
http://aip.metastore.ingenta.com/content/aip/journal/apl/64/5/10.1063/1.111108
10.1063/1.111108
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