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Spectroscopic ellipsometry of Si1− x Ge x epilayers of arbitrary composition 0≤x≤0.255
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10.1063/1.110823
/content/aip/journal/apl/64/9/10.1063/1.110823
http://aip.metastore.ingenta.com/content/aip/journal/apl/64/9/10.1063/1.110823
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/content/aip/journal/apl/64/9/10.1063/1.110823
1994-02-28
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spectroscopic ellipsometry of Si1−xGex epilayers of arbitrary composition 0≤x≤0.255
http://aip.metastore.ingenta.com/content/aip/journal/apl/64/9/10.1063/1.110823
10.1063/1.110823
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