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Nucleation and coalescence in hydrogenated amorphous silicon studied by scanning tunneling microscopy
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10.1063/1.112910
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    Affiliations:
    1 Joint Research Center for Atom Technology (JRCAT), National Institute for Advanced Interdisciplinary Research, 1‐1‐4, Higashi, Tsukuba, Ibaraki 305, Japan
    2 Faculty of Materials Science, University of Tsukuba, Japan, 1‐1‐4, Higashi, Tsukuba, Ibaraki 305, Japan
    3 Joint Research Center for Atom Technology (JRCAT), National Institute for Advanced Interdisciplinary Research, 1‐1‐4, Higashi, Tsukuba, Ibaraki 305, Japan
    4 Electrotechnical Laboratory, 1‐1‐4, Umezono, Tsukuba, Ibaraki 305, Japan
    Appl. Phys. Lett. 65, 1760 (1994); http://dx.doi.org/10.1063/1.112910
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/content/aip/journal/apl/65/14/10.1063/1.112910
1994-10-03
2014-08-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nucleation and coalescence in hydrogenated amorphous silicon studied by scanning tunneling microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/14/10.1063/1.112910
10.1063/1.112910
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