1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Measurement of solid–liquid interface temperature during pulsed excimer laser melting of polycrystalline silicon films
Rent:
Rent this article for
USD
10.1063/1.113044
/content/aip/journal/apl/65/14/10.1063/1.113044
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/14/10.1063/1.113044
/content/aip/journal/apl/65/14/10.1063/1.113044
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/65/14/10.1063/1.113044
1994-10-03
2014-11-28
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of solid–liquid interface temperature during pulsed excimer laser melting of polycrystalline silicon films
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/14/10.1063/1.113044
10.1063/1.113044
SEARCH_EXPAND_ITEM