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1/f noise and electromigration in aluminum films: The role of film microstructure and texture
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10.1063/1.112357
/content/aip/journal/apl/65/3/10.1063/1.112357
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/3/10.1063/1.112357
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/content/aip/journal/apl/65/3/10.1063/1.112357
1994-07-18
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: 1/f noise and electromigration in aluminum films: The role of film microstructure and texture
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/3/10.1063/1.112357
10.1063/1.112357
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