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X‐ray diffractometric characterization of the GaAsP/GaAs and InGaAs/GaAsP superlattices grown on offcut GaAs(001) substrate by means of the reciprocal space mapping
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10.1063/1.112167
/content/aip/journal/apl/65/8/10.1063/1.112167
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/8/10.1063/1.112167
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/content/aip/journal/apl/65/8/10.1063/1.112167
1994-08-22
2015-05-06
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X‐ray diffractometric characterization of the GaAsP/GaAs and InGaAs/GaAsP superlattices grown on offcut GaAs(001) substrate by means of the reciprocal space mapping
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/8/10.1063/1.112167
10.1063/1.112167
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