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Reflection Z‐scan technique for measurements of optical properties of surfaces
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10.1063/1.112175
/content/aip/journal/apl/65/9/10.1063/1.112175
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/9/10.1063/1.112175
/content/aip/journal/apl/65/9/10.1063/1.112175
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/content/aip/journal/apl/65/9/10.1063/1.112175
1994-08-29
2014-10-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reflection Z‐scan technique for measurements of optical properties of surfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/65/9/10.1063/1.112175
10.1063/1.112175
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