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In situ x‐ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow lines
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10.1063/1.113349
/content/aip/journal/apl/66/14/10.1063/1.113349
http://aip.metastore.ingenta.com/content/aip/journal/apl/66/14/10.1063/1.113349
/content/aip/journal/apl/66/14/10.1063/1.113349
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/content/aip/journal/apl/66/14/10.1063/1.113349
1995-04-03
2014-07-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Insitu x‐ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow lines
http://aip.metastore.ingenta.com/content/aip/journal/apl/66/14/10.1063/1.113349
10.1063/1.113349
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