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Nondestructive depth profile measurement of a Co/Ti bilayer using refracted x‐ray fluorescence
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10.1063/1.113900
/content/aip/journal/apl/66/16/10.1063/1.113900
http://aip.metastore.ingenta.com/content/aip/journal/apl/66/16/10.1063/1.113900
/content/aip/journal/apl/66/16/10.1063/1.113900
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/content/aip/journal/apl/66/16/10.1063/1.113900
1995-04-17
2014-07-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nondestructive depth profile measurement of a Co/Ti bilayer using refracted x‐ray fluorescence
http://aip.metastore.ingenta.com/content/aip/journal/apl/66/16/10.1063/1.113900
10.1063/1.113900
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