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Nanometer‐scale recording on chalcogenide films with an atomic force microscope
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10.1063/1.114243
/content/aip/journal/apl/66/22/10.1063/1.114243
http://aip.metastore.ingenta.com/content/aip/journal/apl/66/22/10.1063/1.114243
/content/aip/journal/apl/66/22/10.1063/1.114243
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/content/aip/journal/apl/66/22/10.1063/1.114243
1995-05-29
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanometer‐scale recording on chalcogenide films with an atomic force microscope
http://aip.metastore.ingenta.com/content/aip/journal/apl/66/22/10.1063/1.114243
10.1063/1.114243
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