1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Measuring the tensor nature of stress in silicon using polarized off‐axis Raman spectroscopy
Rent:
Rent this article for
USD
10.1063/1.114125
/content/aip/journal/apl/66/26/10.1063/1.114125
http://aip.metastore.ingenta.com/content/aip/journal/apl/66/26/10.1063/1.114125
/content/aip/journal/apl/66/26/10.1063/1.114125
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/66/26/10.1063/1.114125
1995-06-26
2014-07-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measuring the tensor nature of stress in silicon using polarized off‐axis Raman spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/66/26/10.1063/1.114125
10.1063/1.114125
SEARCH_EXPAND_ITEM