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Band diagram of the polycrystalline CdS/Cu(In,Ga)Se2 heterojunction
1.H.-W. Schock, Mater. Res. Bull. 18, 42 (1993).
2.S.-H. Wei and A. Zunger, Appl. Phys. Lett. 63, 2549 (1993).
3.L. L. Kazmerski, J. P. Ireland, F. R. White, and R. B. Cooper, Proceedings of the 13th IEEE Photovoltaic Specialists Conference, Washington, DC (IEEE, New York, 1978), p. 184; M. Turowski, G. Margaritondo, M. K. Kelly, and R. D. Tomlinson, Phys. Rev. B 31, 1022 (1985).
4.A. J. Nelson, S. Gebhard, A. Rocket, E. Colavita, M. Engelhardt, and H. Höchst, Phys. Rev. B 42, 7518 (1990).
5.T. Löher, W. Jaegermann, and C. Pennenkofer, J. Appl. Phys. 77, 731 (1995).
6.A. J. Nelson, D. W. Niles, S. R. Schwerdtfeger, S. H. Wei, A. Zunger, and H. Höchst, J. Electron Spectrosc. Relat. Phenom. 68, 185 (1994).
7.D. Schmid, M. Ruckh, and H.-W. Schock, Proceedings of the 1st World Conference on Photovoltaic Energy Conversion, Hawaii, 1994, p. 198; D. Schmid, M. Ruckh, F. Grünwald, and H.-W. Schock, J. Appl. Phys. 73, 2902 (1993).
8.J. Hedström, H. Ohlsen, M. Bodegård, A. Kylner, L. Stolt, D. Hariskos, M. Ruckh, and H.-W. Schock, Proc. 23rd IEEE Photovoltaic Specialists Conference, 1993, p. 364; L. Stolt, J. Hedström, J. Kessler, M. Ruckh, K.-O. Velthaus, and H.-W. Schock, Appl. Phys. Lett. 62, 597 (1993).
9.M. Leibovitch, L. Kronik, E. Fefer, V. Korobov, and Y. Shapira, Appl. Phys. Lett. 66, 457 (1995); L. Kronik, M. Leibovitch, E. Fefer, V. Korobov, and Y. Shapira, J. Electron. Mater. 24, 389 (1995).
10.Heterojunction Band Discontinuities, edited by F. Capasso and G. Margaritondo (North-Holland, Amsterdam, 1987).
11.Since we are dealing here with polycrystalline materials, we are following the general approach of representing, whenever possible, the properties of such films by effective ones (that is, those of hypothetical uniform films, with properties that are such that they reflect exactly those of the real film).
12.A. Marshak, IEEE Trans. Electron Devices 36, 1764 (1989).
13.L. Burstein, J. Bregman, and Y. Shapira, J. Appl. Phys. 69, 2312 (1991).
14.M. Bruening, E. Moons, D. Yaron-Marcovich, D. Cahen, J. Libman, and A. Shanzer, J. Am. Chem. Soc. 116, 2972 (1994).
15.L. J. Brillson, J. Vac. Sci. Technol. 16, 1137 (1979).
16.R. D. Campbell and H. E. Farnsworth, Surf. Sci. 10, 197 (1968).
17.The surfaces under study are by no means ideal: The (polycrystalline) surface is randomly oriented, which serves to decrease the net dipole by about 50%. The dipole is further reduced due to severe surface roughness, due to incomplete oxidation, and due to physisorbed water molecules whose permanent dipole moment points in the opposite direction. All these factors reduce the net difference between the two dipoles.
18.J. Beier (unpublished results).
19.M. Leibovitch, L. Kronik, E. Fefer, and Y. Shapira, Phys. Rev. B 50, 1739 (1994).
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