No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Nanofabrication of a two‐dimensional array using laser‐focused atomic deposition
1.G. Timp, R. E. Behringer, D. M. Tennant, J. E. Cunningham, M. Prentiss, and K. K. Berggren, Phys. Rev. Lett. 69, 1636 (1992).
2.J. J. McClelland, R. E. Scholten, E. C. Palm, and R. J. Celotta, Science 262, 877 (1993).
3.R. E. Scholten, J. J. McClelland, E. C. Palm, A. Gavrin, and R. J. Celotta, J. Vac. Sci. Technol. B 12, 1847 (1994).
4.See, e.g., Electron-beam, X-ray and Ion-beam Sub-micrometer Lithographies for Manufacturing II, SPIE Proc. Vol. 1671, edited by M. Peckerar (SPIE, Bellingham, WA, 1992).
5.R. E. Scholten, R. Gupta, J. J. McClelland, and R. J. Celotta (to be published).
6.J. P. Gordon and A. Ashkin, Phys. Rev. A 21, 1606 (1980); J. Dalibard and C. Cohen-Tannoudji, J. Opt. Soc. Am. B 2, 1707 (1985).
7.The net electric field can be determined by combining the four traveling waves , , , where and are the complex electric field amplitudes determining the magnitude and polarization state of a wave traveling in the -direction, and are the corresponding amplitudes for a wave traveling in the -direction, and is the relative temporal phase for the two waves. See, e.g., J. D. Jackson, Classical Electrodynamics, 2nd ed. (Wiley, New York, 1975), pp. 273 ff.
8.A. Hemmerich, D. Schropp, Jr., and T. W. Hänsch, Phys. Rev. A 44, 1910 (1991).
9.G. Grynberg, B. Lounis, P. Verkerk, J.-Y. Courtois, and C. Salomon, Phys. Rev. Lett. 70, 2249 (1993).
10.J. J. McClelland, J. Opt. Soc. Am. B (in press).
11.For Cr, the variation can be as much as a factor of 28. See, e.g., V. G. Minogin and V. S. Letokhov, Laser Light Pressure on Atoms (Gordon and Breach, New York, 1987).
12.Uncertainty estimates quoted in this paper are to be interpreted as one standard deviation combined random and systematic uncertainties unless otherwise indicated.
13.N. I. Maluf, S. Y. Chou, J. P. McVittie, S. W. J. Kuan, . R. Allee, and R. F. W. Pease, J. Vac. Sci. Technol. B 7, 1497 (1989).
Article metrics loading...
Full text loading...
Most read this month
Most cited this month