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Near‐field optoelectronic detector probes based on standard scanning force cantilevers
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10.1063/1.114760
/content/aip/journal/apl/67/14/10.1063/1.114760
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/14/10.1063/1.114760
/content/aip/journal/apl/67/14/10.1063/1.114760
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/content/aip/journal/apl/67/14/10.1063/1.114760
1995-10-02
2014-10-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Near‐field optoelectronic detector probes based on standard scanning force cantilevers
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/14/10.1063/1.114760
10.1063/1.114760
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