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Open‐core screw dislocations in GaN epilayers observed by scanning force microscopy and high‐resolution transmission electron microscopy
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10.1063/1.115127
/content/aip/journal/apl/67/16/10.1063/1.115127
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/16/10.1063/1.115127
/content/aip/journal/apl/67/16/10.1063/1.115127
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/content/aip/journal/apl/67/16/10.1063/1.115127
1995-10-16
2014-07-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Open‐core screw dislocations in GaN epilayers observed by scanning force microscopy and high‐resolution transmission electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/16/10.1063/1.115127
10.1063/1.115127
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