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Study of band offsets in CdF2/CaF2/Si(111) heterostructures using x‐ray photoelectron spectroscopy
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10.1063/1.114595
/content/aip/journal/apl/67/19/10.1063/1.114595
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/19/10.1063/1.114595
/content/aip/journal/apl/67/19/10.1063/1.114595
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/content/aip/journal/apl/67/19/10.1063/1.114595
1995-11-06
2014-10-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Study of band offsets in CdF2/CaF2/Si(111) heterostructures using x‐ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/19/10.1063/1.114595
10.1063/1.114595
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