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Sharpened electron beam deposited tips for high resolution atomic force microscope lithography and imaging
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10.1063/1.115365
/content/aip/journal/apl/67/25/10.1063/1.115365
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/25/10.1063/1.115365
/content/aip/journal/apl/67/25/10.1063/1.115365
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/content/aip/journal/apl/67/25/10.1063/1.115365
1995-12-18
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Sharpened electron beam deposited tips for high resolution atomic force microscope lithography and imaging
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/25/10.1063/1.115365
10.1063/1.115365
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