No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Surface‐related breakdown in silicon: Imaging of current filaments in long p +‐n −‐n + structures
1.C. G. B. Garrett and W. H. Brattain, J. Appl. Phys. 27, 299 (1956).
2.F. E. Peterkin, T. Ridolfi, L. L. Buresh, B. J. Hankla, D. K. Scott, P. F. Williams, W. C. Nunnally, and B. L. Thomas, IEEE Trans. Electron. Devices ED-37, 2456 (1990).
3.W. C. Nunnally, 5th IEEE Pulsed Power Conference, edited by M. F. Rose and P. J. Turchi (IEEE, New York, 1985), pp. 235–241.
4.G. M. Loubriel, M. W. O’Malley, and F. J. Zutavern, 6th IEEE Pulsed Power Conference, edited by P. J. Turchi and B. H. Bernstein (IEEE, New York, 1987), pp. 145–148.
5.E. E. Funk, E. A Chauchard, Chi H. Lee, and M. J. Rhee, Proceedings of the 4th SDIO/ONR Pulse Power Meeting, 1991, pp. 12–22.
6.D. M. Giorgi, A. H. Griffin, D. E. Hargis, I. A. McIntyre, and O. S. F. Zucker, 8th IEEE Pulsed Power Conference, edited by R. White and K. Prestwich (IEEE, New York, 1991), pp. 122–125.
7.R. J. Antinone, Electrical Overstress Protection for Electronic Devices (Noyes, Engelwood Cliffs, NJ, 1986).
8.B. I. Thomas and W. C. Nunnally, in Ref. 4, pp. 149–152.
9.R. J. Feuerstein and B. Senitzky, J. Appl. Phys. 70, 288 (1991).
10.J. M. Elizondo and W. M. Moeny, in Ref. 6, pp. 1020–1023.
11.P. F Williams and F. E Peterkin, 7th IEEE Pulsed Power Conference, edited by B. H. Bernstein and J. P. Shannon (IEEE, New York, 1989), pp. 890–892.
12.F. E Peterkin, P. F. Williams, T. Ridolfi, B. J. Hankla, and L. L. Buresh, in Ref. 6, pp. 118–121.
13.F. E. Peterkin, P. F. Williams, B. J. Hankla, L. L. Buresh, and S. A. Woodward, Appl. Phys. Lett. 62, 2236 (1993).
14.L. A. Vasilev, Schlieren Methods (Keter, New York, 1986).
15.G. E. Jellison , Jr. and F. A. Modine, J. Appl. Phys. 76, 3758 (1994).
16.See for example: Charles Kittel, Introduction to Solid State Physics (Wiley, New York, 1986).
17.I. Gallimberti, J. Phys. 40, C7 (1979).
18.J. F. Gibbons, IEEE Trans. Electron Devices ED-14, 37 (1967).
19.P. F. Williams and F. E. Peterkin, Physics and Applications of Pseudosparks, edited by M. Gundersen and G. Schaefer (Plenum, New York, 1990).
20.C. D. Capps, R. A. Falk, and J. C. Adams, J. Appl. Phys. 74, 6645 (1993).
21.G. M. Loubriel, F. J. Zutavern, H. P. Hjalmarson, R. R. Gallegos, W. D. Helgeson, and M. W. O’Malley, Appl. Phys. Lett. 64, 3323 (1994).
Article metrics loading...
Full text loading...
Most read this month
Most cited this month