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Addendum: ‘‘Influence of misfit dislocations on the surface morphology of Si1−x Ge x films’’ [Appl. Phys. Lett. 66, 724 (1995)]
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1.M. A. Lutz, R. M. Feenstra, F. K. LeGoues, P. M. Mooney, and J. O. Chu, Appl. Phys. Lett. 66, 724 (1995).
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1995-07-31
2014-04-19
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Scitation: Addendum: ‘‘Influence of misfit dislocations on the surface morphology of Si1−xGex films’’ [Appl. Phys. Lett. 66, 724 (1995)]
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/5/10.1063/1.115287
10.1063/1.115287
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