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Determination of the dielectric tensor in anisotropic materials
1.R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
2.P. J. McMarr, K. Vedam, and J. Narayan, J. Appl. Phys. 59, 694 (1986), and references therein.
3.D. E. Aspnes, J. Opt. Soc. Am. 70, 1275 (1980).
4.Y. Tokura, H. Tokagi, and S. Uchida, Nature 337, 345 (1989).
5.S. Piñol, F. Fontcuberta, C. Miravitlles, and D. McK. Paul, Physica C 165, 265 (1990).
6.D. J. De Smet, J. Appl. Phys. 76, 2571 (1994).
7.Model ES4G, manufactured by SOPRA, Bois-Colombes, France.
8.D. J. De Smet, J. Opt. Soc. Am. 63, 958 (1973).
9.P. Yeh, Surf. Sci. 96, 41 (1980).
10.M. Garriga, Ph. D. thesis, University of Stuttgart, 1990.
11.F. Alsina, M. Garriga, M. I. Alonso, J. Pascual, J. Camassel, and R. W. Glew, in 22nd International Conference on the Physics of Semiconductors, edited by D. J. Lockwood (World Scientific, Singapore, 1995), Vol. 1, p. 253.
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