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Critical current‐length product for electromigration induced resistance changes in short Al lines
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10.1063/1.115015
/content/aip/journal/apl/67/9/10.1063/1.115015
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/9/10.1063/1.115015
/content/aip/journal/apl/67/9/10.1063/1.115015
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/content/aip/journal/apl/67/9/10.1063/1.115015
1995-08-28
2014-12-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Critical current‐length product for electromigration induced resistance changes in short Al lines
http://aip.metastore.ingenta.com/content/aip/journal/apl/67/9/10.1063/1.115015
10.1063/1.115015
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