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Study of anomalous peak in the dielectric spectra of CdTe thin films using photoellipsometry
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10.1063/1.116655
/content/aip/journal/apl/68/13/10.1063/1.116655
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/13/10.1063/1.116655
/content/aip/journal/apl/68/13/10.1063/1.116655
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/content/aip/journal/apl/68/13/10.1063/1.116655
1996-03-25
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Study of anomalous peak in the dielectric spectra of CdTe thin films using photoellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/13/10.1063/1.116655
10.1063/1.116655
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