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Initial stage of layer‐by‐layer sputtering of Si(111) surfaces studied by scanning reflection electron microscopy
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10.1063/1.115839
/content/aip/journal/apl/68/18/10.1063/1.115839
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/18/10.1063/1.115839
/content/aip/journal/apl/68/18/10.1063/1.115839
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/content/aip/journal/apl/68/18/10.1063/1.115839
1996-04-29
2014-07-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Initial stage of layer‐by‐layer sputtering of Si(111) surfaces studied by scanning reflection electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/18/10.1063/1.115839
10.1063/1.115839
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