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Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing
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10.1063/1.116172
/content/aip/journal/apl/68/18/10.1063/1.116172
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/18/10.1063/1.116172
/content/aip/journal/apl/68/18/10.1063/1.116172
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/content/aip/journal/apl/68/18/10.1063/1.116172
1996-04-29
2014-07-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/18/10.1063/1.116172
10.1063/1.116172
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