1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Low‐frequency noise in 4H–silicon carbide junction field effect transistors
Rent:
Rent this article for
USD
10.1063/1.116276
/content/aip/journal/apl/68/19/10.1063/1.116276
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/19/10.1063/1.116276
Loading

Article metrics loading...

/content/aip/journal/apl/68/19/10.1063/1.116276
1996-05-06
2014-04-18
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low‐frequency noise in 4H–silicon carbide junction field effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/19/10.1063/1.116276
10.1063/1.116276
SEARCH_EXPAND_ITEM