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X‐ray crystallographic study of GaN epitaxial films on Al2O3(0001) substrates with GaN buffer layers
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10.1063/1.115786
/content/aip/journal/apl/68/24/10.1063/1.115786
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/24/10.1063/1.115786
/content/aip/journal/apl/68/24/10.1063/1.115786
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/content/aip/journal/apl/68/24/10.1063/1.115786
1996-06-10
2014-11-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X‐ray crystallographic study of GaN epitaxial films on Al2O3(0001) substrates with GaN buffer layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/24/10.1063/1.115786
10.1063/1.115786
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