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Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films
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10.1063/1.116495
/content/aip/journal/apl/68/5/10.1063/1.116495
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/5/10.1063/1.116495
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/content/aip/journal/apl/68/5/10.1063/1.116495
1996-01-29
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/5/10.1063/1.116495
10.1063/1.116495
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