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Erratum: ‘‘Defect‐free band‐edge photoluminescence and band gap measurement of pseudomorphic Si1−xy Ge x Cy alloy layers on Si (100)’’ [Appl. Phys. Lett. 67, 3915 (1995)]
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Scitation: Erratum: ‘‘Defect‐free band‐edge photoluminescence and band gap measurement of pseudomorphic Si1−x−yGexCy alloy layers on Si (100)’’ [Appl. Phys. Lett. 67, 3915 (1995)]
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/8/10.1063/1.116797
10.1063/1.116797
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